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 Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]

 Kadah, Fika Abdul-Ghany Saeed

//uquui/handle/20.500.12248/98373
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Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]

Authors : Kadah, Fika Abdul-Ghany Saeed
Call Number : 11885
Publisher :1982 1402
Issue Date : -
Description : 21 Paper.
Format : ماجستير
Collage : التربية
Department : الفيزياء
URL : https://dorar.uqu.edu.sa/uquui/handle/20.500.12248/98373
Appears in Collections : الرسائل العلمية المحدثة

Title: Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]
Authors: Kadah, Fika Abdul-Ghany Saeed
Mokhtar, S. Supervision;Umm Al-qura University
Publisher :: 1982 1402
Description :: 21 Paper.
14
Master Thesis
URI: https://dorar.uqu.edu.sa/uquui/handle/20.500.12248/98373
Appears in Collections :الرسائل العلمية المحدثة

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