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 Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]

 Kadah, Fika Abdul-Ghany Saeed

//uquui/handle/20.500.12248/98373
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DC FieldValueLanguage
dc.contributor.authorKadah, Fika Abdul-Ghany Saeed
dc.contributor.authorMokhtar, S. Supervision;Umm Al-qura University
dc.date.accessioned2020-01-17T11:25:06Z-
dc.date.available2020-01-17T11:25:06Z-
dc.identifier.urihttps://dorar.uqu.edu.sa/uquui/handle/20.500.12248/98373-
dc.description21 Paper.
dc.description14
dc.descriptionMaster Thesis
dc.publisher1982 1402
dc.titleThickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]
dc.types
dc.identifier.idb1162405x
dc.identifier.callnum11885
dc.type.formatماجستير
dc.relation.univUmm Al-qura University
dc.publisher.countryNULL
dc.relation.collageالتربية
dc.rights.holdYes
dc.rights.digitalYes
dc.relation.depالفيزياء
Appears in Collections :الرسائل العلمية المحدثة

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