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Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis]
Authors :
Kadah, Fika Abdul-Ghany Saeed
Call Number : 11885
Publisher :1982 1402
Issue Date :
-
Description :
21 Paper.
Format : ماجستير
Collage :
التربية
Department :
الفيزياء
Appears in Collections :
الرسائل العلمية المحدثة
Title: | Thickness measurement of evaporated thin metalic film by multiple beam interference frings at reflection [thesis] |
Authors: | Kadah, Fika Abdul-Ghany Saeed Mokhtar, S. Supervision;Umm Al-qura University |
Publisher :: | 1982 1402 |
Description :: | 21 Paper. 14 Master Thesis |
URI: | https://dorar.uqu.edu.sa/uquui/handle/20.500.12248/98373 |
Appears in Collections : | الرسائل العلمية المحدثة |
Files in This Item :
File | Description | Size | Format | |
---|---|---|---|---|
b1162405x_2.pdf " Restricted Access" | 63.53 kB | Adobe PDF | View/OpenRequest a copy | |
b1162405x_3.pdf " Restricted Access" | 14.27 kB | Adobe PDF | View/OpenRequest a copy | |
b1162405x_5.pdf " Restricted Access" | 19.7 kB | Adobe PDF | View/OpenRequest a copy | |
b1162405x_6.html " Restricted Access" | 837 B | HTML | View/OpenRequest a copy |
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